TESTING
With a broad array of testing capability, Amphenol Printed Circuits provides the knowledge and equipment necessary to ensure your products are operating within anticipated design parameters. With a full suite of advanced testing equipment, supporting testing levels I thru IV, the Amphenol Advantage affords customers the broadest array of test solutions possible.
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LEVEL 1
FLYING PROBE
ATG A7-16
- Continuity Kelvin 4 Wire: 0.1mΩ - 300KΩ
- Continuity 2 Wire: 2 – 10KΩ
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Isolation: Up to 1000V
- Up to 25MΩ (Field Measurement)
- Up to 10GΩ (Resistive)
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Embedded Component Test
- Resistors, Capacitors, Inductors, Diodes
- Latent Defect Testing
- 24 x 39.4” Test Area
- Soft Touch Probe Technology
ATG A6-16
- Continuity 2 Wire: 2 – 10KΩ
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Isolation: Up to 500V
- Up to 10GΩ (Resistive)
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Embedded Component Test
- Resistors, Capacitors, Inductors, Diodes
- 24 x 24” Test Area
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LEVEL 1
BED OF NAILS
Everett Charles 9090
- 25.6 x 19.2” Single Density, Double Sided Grid
- Continuity 2 Wire: 5 - 600 Ω
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Isolation: Up to 250V
- Up to 100MΩ
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LEVEL 1
OTHER TESTING OPTIONS
Hipot
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Automated (DITMCO 2115)
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Up to 1500VDC
- 1GΩ IR
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Up to 1500VDC
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Manual (Associated Research Hipot Ultra II 7540DT)
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DC Withstanding
- Up to 6000VDC
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AC Withstanding
- Up to 5000VAC
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IR
- Up to 1000VDC
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DC Withstanding
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Breakdown (Hipotronics 750-02-D149)
- Up to 50KVAC
Impendance
- Polar RITS Robotic Impedance Station
- Polar CITS 500s4 Manual Impedance Station
Signal Integrity/TDR
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Introbotix Accuprober HF50
- Tektronix DSA8300 Analyzer
- Tektronix 80e10B 50GHz TDR Sampling Heads
- VNA (S-Parameter) Measurements up to 50GHz
- SET2DIL/SET2SEIL Measurements up to 30GHz
- SPP (Short Pulse Propagation) Measurements up to 50GHz
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Automated (DITMCO 2115)
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level 2
Bed of Nails
TTI 44K
- Continuity 2 Wire: 5
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100Ω Isolation up to 250V
- Up to 10GΩ
- 24 x 18” Single Density, Single Sided Test area
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Embedded Components
- Resistors
- All other components are protected from Isolation Voltage Only.
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level 2
CABLE TESTER
Omni 2501
- Continuity 2 Wire: 2 -999KΩ
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Isolation: Up to 500V
- Up to 500MΩ
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level 3
Bed of Nails
In-Circuit Test (Assembly)
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Seica Inc.
- V8 Flying Probe
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LCX Software
- Takaya 9400 Flying Probe
- Teradyne Test Station TS128LX
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Seica Inc.
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level 4
Functional Test (Assembly)
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Y-Tek FT100
- +5V (1A), +12V(1A), -12V(1A), Programmable 0-10V(1A)
- 40 Digital GPIO’s (TTL Switch Levels)
- 8 Analog Inputs (0 – 10V or +/-5V) 12 Bit Resolution
- 7 Outputs (0 – 10V or +/-5V) – 4 12 Bit Resolution.
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Y-Tek FT100